Rapid spatial characterization measurements of a multi-element focal plane using derived geometrical information

James W. Baer; Thomas F. Drouillard II

doi:10.1117/12.929117

15 October 2012 Rapid spatial characterization measurements of a multi-element focal plane using derived geometrical information

James W. Baer, Thomas F. Drouillard II

Author Affiliations +

Proceedings Volume 8491, Optical System Alignment, Tolerancing, and Verification VI; 84910C (2012) https://doi.org/10.1117/12.929117
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

While some instrument requirements are levied on a per-pixel basis, efficiencies and economies can be gained by testing them in parallel. Furthermore, the use of detector arrays as imagers with extended targets enables the derivation of geometrical information from select pixels in each image, and its propagation to neighboring pixels. We discuss the implementation of one such test regime for the Operational Landsat Imager (OLI) at Ball Aerospace and Technologies Corp. This enabled rapid measurement of spatial parameters, including Edge Response Function and aliasing, for all of the nearly 70,000 active pixels of the focal plane assembly with reduced reliance on the precision and stability of the supporting equipment. The derived geometrical information enabled us to replace a step-stare testing of individual pixels with a continuous scan of the entire assembly, without demanding precision motion or introducing noise from variations in the scan velocity. Three complete scans were performed in under 30 hours.

Citation Download Citation

James W. Baer and Thomas F. Drouillard II "Rapid spatial characterization measurements of a multi-element focal plane using derived geometrical information", Proc. SPIE 8491, Optical System Alignment, Tolerancing, and Verification VI, 84910C (15 October 2012); https://doi.org/10.1117/12.929117

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