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15 October 2012 Solar cell imaging and characterization by terahertz techniques
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Enhanced attention to solar cell development stimulates search of innovative solutions to their characterization and identification of possible technological defects in various steps of production in a contactless way. In the given work, investigation of solar cells structures by means of terahertz (THz) imaging is presented. Both continuous wave and pulsed THz imaging set-ups were employed in this study. Investigated objects included typical for various production stages test silicon structures – structured and unstructured surfaces, metalized and unmetalized contact areas, commercial silicon solar cells. We demonstrate that phase sensitive subTHz imaging can be employed for detecting manufacturing defects of the solder tabs, while images at higher frequencies reveal finer details of solar cells, such as cracks or different reflection coefficients for structured and unstructured surfaces with different doping.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Linas Minkevičius, Rasa Suzanovičienė, Gediminas Molis, Arūnas Krotkus, Saulius Balakauskas, Rimvydas Venckevičius, Irmantas Kašalynas, Dalius Seliuta, Gintaras Valušis, and Vincas Tamošiūnas "Solar cell imaging and characterization by terahertz techniques", Proc. SPIE 8496, Terahertz Emitters, Receivers, and Applications III, 849613 (15 October 2012);


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