Spectral encoding based measurement of x-ray/optical relative delay to ~10 fs rms

Mina R. Bionta; Doug French; James P. Cryan; James M. Glownia; Nick Hartmann; David J. Nicholson; Kevin Baker; Christoph Bostedt; Marco Cammarrata; Matthieu Chollet; Yuantao Ding; David M. Fritz; Steve M. Durbin; Yiping Feng; Marion Harmand; Alan R. Fry; Daniel J. Kane; Jacek Krzywinski; Henrik T. Lemke; Marc Messerschmidt; Daniel F. Ratner; Sebastian Schorb; Sven Toleikis; Diling Zhu; William E. White; Ryan N. Coffee

doi:10.1117/12.929097

15 October 2012 Spectral encoding based measurement of x-ray/optical relative delay to ~10 fs rms

Mina R. Bionta, Doug French, James P. Cryan, James M. Glownia, Nick Hartmann, David J. Nicholson, Kevin Baker, Christoph Bostedt, Marco Cammarrata, Matthieu Chollet, Yuantao Ding, David M. Fritz, Steve M. Durbin, Yiping Feng, Marion Harmand, Alan R. Fry, Daniel J. Kane, Jacek Krzywinski, Henrik T. Lemke, Marc Messerschmidt, Daniel F. Ratner, Sebastian Schorb, Sven Toleikis, Diling Zhu, William E. White, Ryan N. Coffee

Author Affiliations +

Proceedings Volume 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications; 85040M (2012) https://doi.org/10.1117/12.929097
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ~10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si₃N₄). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.

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Mina R. Bionta, Doug French, James P. Cryan, James M. Glownia, Nick Hartmann, David J. Nicholson, Kevin Baker, Christoph Bostedt, Marco Cammarrata, Matthieu Chollet, Yuantao Ding, David M. Fritz, Steve M. Durbin, Yiping Feng, Marion Harmand, Alan R. Fry, Daniel J. Kane, Jacek Krzywinski, Henrik T. Lemke, Marc Messerschmidt, Daniel F. Ratner, Sebastian Schorb, Sven Toleikis, Diling Zhu, William E. White, and Ryan N. Coffee "Spectral encoding based measurement of x-ray/optical relative delay to ~10 fs rms", Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040M (15 October 2012); https://doi.org/10.1117/12.929097

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