Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals

Hiroyuki Toda; Darren LeClere; Takanobu Kamiko; Yoshio Suzuki; Akihisa Takeuchi; Kentaro Uesugi; Masakazu Kobayashi

doi:10.1117/12.930608

17 October 2012 Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals

Hiroyuki Toda, Darren LeClere, Takanobu Kamiko, Yoshio Suzuki, Akihisa Takeuchi, Kentaro Uesugi, Masakazu Kobayashi

Author Affiliations +

Proceedings Volume 8506, Developments in X-Ray Tomography VIII; 85060B (2012) https://doi.org/10.1117/12.930608
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass%Cu alloy was used for demonstration purpose.

Citation Download Citation

Hiroyuki Toda, Darren LeClere, Takanobu Kamiko, Yoshio Suzuki, Akihisa Takeuchi, Kentaro Uesugi, and Masakazu Kobayashi "Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals", Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 85060B (17 October 2012); https://doi.org/10.1117/12.930608

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available