Heterojunction versus homojunction transit time devices at
elevated junction temperature: performance comparison at MMwave
window frequency

Moumita Mukherjee; Diptadip Chakraborty; Arijit Das

doi:10.1117/12.927421

15 October 2012 Heterojunction versus homojunction transit time devices at elevated junction temperature: performance comparison at MMwave window frequency

Moumita Mukherjee, Diptadip Chakraborty, Arijit Das

Author Affiliations +

Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 85490G (2012) https://doi.org/10.1117/12.927421
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India

Abstract

Prospects of Si/Si_0.8Ge_0.2 heterojunction IMPATT devices are studied through a modified simulation technique and their performances are further compared with those of homojunction devices. This high-frequency study includes the effects of mobile space charge, parasitic resistance and also considered the detrimental role of elevated junction temperature on the maximum exploitable power level from the devices. The study indicates that under similar operating condition, Si/SiGe heterojunction IMPATT is capable of delivering a RF-power output of nearly 6W (efficiency 21%), two times higher than that from Si_0.8Ge_0.2 homojunction diode, which is only 13% efficient. The overall study indicates the superiority of the heterojunction diodes over their homojunction counterparts as far as negative resistance, device impedance and quality factor are concerned. To the best of author’s knowledge, this is the first report on highfrequency analysis of Si/Si_0.8Ge_0.2 heterojunction IMPATT.

Citation Download Citation

Moumita Mukherjee, Diptadip Chakraborty, and Arijit Das "Heterojunction versus homojunction transit time devices at elevated junction temperature: performance comparison at MMwave window frequency", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85490G (15 October 2012); https://doi.org/10.1117/12.927421

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KEYWORDS

Diodes

Heterojunctions

Silicon

Resistance

Doping

Germanium

Compound semiconductors

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