Paper
15 October 2012 Formation and optical properties of amorphous carbon film having embedded nanoparticles deposited by anodic jet carbon arc technique
R. K. Tripathi, O. S. Panwar, Ajay Kesarwani, Sushil Kumar, A. Basu
Author Affiliations +
Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 85492F (2012) https://doi.org/10.1117/12.927423
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India
Abstract
This paper reports the formation and optical properties of amorphous carbon film having embedded nanoparticles deposited by anodic jet carbon arc technique (AJCA). The films deposited have been characterized by x-ray diffraction (XRD), high resolution transmission electron microscope (HRTEM), and scanning electron microscope (SEM) and spectroscopy ellipsometry (SE) measurements. XRD pattern exhibits dominantly an amorphous nature of film. HRTEM investigation shows initially the amorphous structure. However, on closer examination nanoparticles were found to be embedded in the amorphous matrix. The effect of substrate bias and the magnetic field on the optical constants evaluated from SE have been studied. On comparison of deposition condition with and without magnetic field used in growing a-C films there is a change in the values of optical constants.
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R. K. Tripathi, O. S. Panwar, Ajay Kesarwani, Sushil Kumar, and A. Basu "Formation and optical properties of amorphous carbon film having embedded nanoparticles deposited by anodic jet carbon arc technique", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85492F (15 October 2012); https://doi.org/10.1117/12.927423
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KEYWORDS
Carbon

Nanoparticles

Magnetism

Scanning electron microscopy

Optical properties

Electron microscopes

Helium

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