Paper
18 December 2012 The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer
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Abstract
A highly efficient method for splitting the probe beam produced by a scanning low-coherence distance-measuring interferometer (SLCDI) is presented. The SLCDI is used to measure thicknesses of materials with thicknesses in the range of 12 microns-50 mm, with a repeatability of 0.1 microns. The measurements are made optically with a beam with a wavelength of 1.3 microns. The SLCDI is also capable of simultaneous measurement of a stack of multiple films. Splitting of the beam from the SLCDI probe to create a multi-point probe allows for multiple, simultaneous measurements to be made at a surface. An advantage of this capability is that it provides the ability of to measure the surface normal at each of the surfaces that are under test. The operation of the SLCDI will be described along with how the operation impacts the requirements for the multi-point probe system. The requirements are discussed from the standpoint of the coherence length of the SLCDI source and the operational usage of the probe. The splitting is achieved through the use of polarization components. The function and performance of the resulting probe is also discussed.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher T. Cotton, Christopher J. Ditchman, Nathan E. Burdick, and Damon W. Diehl "The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer", Proc. SPIE 8550, Optical Systems Design 2012, 85500W (18 December 2012); https://doi.org/10.1117/12.980928
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KEYWORDS
Prisms

Polarization

Interferometers

Beam splitters

Optical testing

Prototyping

Freeform optics

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