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26 November 2012 Smile effect detection for dispersive hypersepctral imager based on the doped reflectance panel
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Hyperspectral imager is now widely used in many regions, such as resource development, environmental monitoring and so on. The reliability of spectral data is based on the instrument calibration. The smile, wavelengths at the center pixels of imaging spectrometer detector array are different from the marginal pixels, is a main factor in the spectral calibration because it can deteriorate the spectral data accuracy. When the spectral resolution is high, little smile can result in obvious signal deviation near weak atmospheric absorption peak. The traditional method of detecting smile is monochromator wavelength scanning which is time consuming and complex and can not be used in the field or at the flying platform. We present a new smile detection method based on the holmium oxide panel which has the rich of absorbed spectral features. The higher spectral resolution spectrometer and the under-test imaging spectrometer acquired the optical signal from the Spectralon panel and the holmium oxide panel respectively. The wavelength absorption peak positions of column pixels are determined by curve fitting method which includes spectral response function sequence model and spectral resampling. The iteration strategy and Pearson coefficient together are used to confirm the correlation between the measured and modeled spectral curve. The present smile detection method is posed on our designed imaging spectrometer and the result shows that it can satisfy precise smile detection requirement of high spectral resolution imaging spectrometer.
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Jiankang Zhou, Xiaoli Liu, Yiqun Ji, Yuheng Chen, and Weimin Shen "Smile effect detection for dispersive hypersepctral imager based on the doped reflectance panel", Proc. SPIE 8557, Optical Design and Testing V, 85571T (26 November 2012);

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