Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium

Roger J. Zemp

doi:10.1117/12.2005036

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21 February 2013 Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium

Roger J. Zemp

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Proceedings Volume 8592, Biomedical Applications of Light Scattering VII; 85920I (2013) https://doi.org/10.1117/12.2005036
Event: SPIE BiOS, 2013, San Francisco, California, United States

Abstract

Oblique incidence reflectometry (OIR) is an established technique for estimation of tissue optical properties, however, a sensing footprint of a few transport mean-free paths is often needed when diffusion-regime-based algorithms are used. Smaller-footprint probes require improved light-propagation models and inversion schemes for diffuse reflectance close to the point-of-entry but might enable micro-endoscopic form factors for clinical assessments of cancers and pre-cancers. In this paper we extend the phase-function corrected diffusion-theory presented by Vitkin et al. (Nat. Comm 2011) to the case of pencil beams obliquely incident on a semi-infinite turbid medium. The model requires minimal computational resources and offers improved accuracy over more traditional diffusion-theory approximations models when validated against Monte Carlo simulations. The computationally efficient nature of the models may lend themselves to rapid fitting procedures for inverse problems.

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Roger J. Zemp "Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium", Proc. SPIE 8592, Biomedical Applications of Light Scattering VII, 85920I (21 February 2013); https://doi.org/10.1117/12.2005036

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