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14 March 2013 Silicon slot waveguides and their rigorous characterization
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Proceedings Volume 8629, Silicon Photonics VIII; 86290K (2013)
Event: SPIE OPTO, 2013, San Francisco, California, United States
The optical properties of a nanoscale silicon slot-waveguide has been rigorously studied by using a full vectorial H-field finite element method (VFEM) based approach and presented in this paper. The variations of effective indices, effective areas, power densities in the slot-region and the confinement factors of the slot waveguide, with both horizontal and vertical slots, are thoroughly investigated for quasi-TM and TE modes. The full vectorial magnetic and electric field profiles, and Poynting vector (Sz) are also presented.
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B. M. A. Rahman, D. M. H. Leung, N. Kejalakshmy, and Long To "Silicon slot waveguides and their rigorous characterization", Proc. SPIE 8629, Silicon Photonics VIII, 86290K (14 March 2013);

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