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14 March 2013 Silicon slot waveguides and their rigorous characterization
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Proceedings Volume 8629, Silicon Photonics VIII; 86290K (2013) https://doi.org/10.1117/12.2008203
Event: SPIE OPTO, 2013, San Francisco, California, United States
Abstract
The optical properties of a nanoscale silicon slot-waveguide has been rigorously studied by using a full vectorial H-field finite element method (VFEM) based approach and presented in this paper. The variations of effective indices, effective areas, power densities in the slot-region and the confinement factors of the slot waveguide, with both horizontal and vertical slots, are thoroughly investigated for quasi-TM and TE modes. The full vectorial magnetic and electric field profiles, and Poynting vector (Sz) are also presented.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. M. A. Rahman, D. M. H. Leung, N. Kejalakshmy, and Long To "Silicon slot waveguides and their rigorous characterization", Proc. SPIE 8629, Silicon Photonics VIII, 86290K (14 March 2013); https://doi.org/10.1117/12.2008203
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