Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal

T. Denis; B. Reijnders; J. H. H. Lee; W. L Vos; K.-J. Boller; P. J. M. van der Slot

doi:10.1117/12.2002945

21 February 2013 Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal

T. Denis, B. Reijnders, J. H. H. Lee, W. L Vos, K.-J. Boller, P. J. M. van der Slot

Author Affiliations +

Proceedings Volume 8632, Photonic and Phononic Properties of Engineered Nanostructures III; 863211 (2013) https://doi.org/10.1117/12.2002945
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

We present a method to map the absolute electromagnetic field strength inside photonic crystals. We demonstrate our method by applying it to map the electric field component E_z of a two-dimensional photonic crystal slab at microwave frequencies. The slab is placed between two mirrors to create a resonator and a subwavelength spherical scatterer is scanned inside the resonator. The resonant Bloch frequencies shift depending on the electric field at the scatterer position. By measuring the frequency shift in the reflection and transmission spectrum versus the scatterer position we determine the field strength. Excellent agreement is found between measurements and calculations without any adjustable parameters and a possible realization is suggested for measurements at optical frequencies.

Citation Download Citation

T. Denis, B. Reijnders, J. H. H. Lee, W. L Vos, K.-J. Boller, and P. J. M. van der Slot "Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal", Proc. SPIE 8632, Photonic and Phononic Properties of Engineered Nanostructures III, 863211 (21 February 2013); https://doi.org/10.1117/12.2002945

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