New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Tsung-Ling Li; Yasuyuki Goda; Shunichi Wakashima; Rihito Kuroda; Shigetoshi Sugawa

doi:10.1117/12.2003741

19 February 2013 New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Tsung-Ling Li, Yasuyuki Goda, Shunichi Wakashima, Rihito Kuroda, Shigetoshi Sugawa

Author Affiliations +

Proceedings Volume 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV; 86590E (2013) https://doi.org/10.1117/12.2003741
Event: IS&T/SPIE Electronic Imaging, 2013, Burlingame, California, United States

Abstract

This paper presents a new analog readout architecture for low-noise CMOS image sensors. A proposed forward noisecanceling circuitry has been developed in our readout architecture to provide a sharper noise-filtering. The new readout architecture consists of a column high-gain amplifier with correlated-double-sampling (CDS), a column forward noisecanceling circuitry, and column sample-and-hold circuits. Through the high-gain amplifier together with the forward noise-canceling circuitry, this readout architecture effectively reduces random noise of in-pixel source follower and column amplifier as well as temporal line noise from power supplies and pulse lines. A prototype 400(H) x 250(V) CMOS image sensor using the new readout architecture has been fabricated in a 0.18 μm 1-Poly 3-Metal CMOS technology with pinned-photodiode. Both the pixel pitch and the column circuit pitch are 4.5 μm. The input-referred noise of the new readout architecture is 37 μV_rms, which has been reduced by 23 % compared to that of the conventional readout architecture. The input-referred noise of the pixel with new readout architecture is 72 μV_rms, which has been reduced by 24 % compared to that of the pixel with conventional readout architecture.

Citation Download Citation

Tsung-Ling Li, Yasuyuki Goda, Shunichi Wakashima, Rihito Kuroda, and Shigetoshi Sugawa "New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry", Proc. SPIE 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, 86590E (19 February 2013); https://doi.org/10.1117/12.2003741

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KEYWORDS

Analog electronics

Amplifiers

Interference (communication)

CMOS sensors

Vacuum fluorescent displays

Cadmium sulfide

Voltage controlled current source

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