Paper
11 December 2012 Comparison of laboratory-scale XUV laser with xFELs
Davide Bleiner
Author Affiliations +
Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 867806 (2012) https://doi.org/10.1117/12.2008733
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland
Abstract
Amplification of short-wavelength radiation is advantageously done across a plasma medium. The latter can be produced either using a powerful pump laser or by means of a capillary discharge. The main advantages of this scheme are the ultra-narrow linewidth (Q ≈ 10,000), the full temporal coherence, and the compact footprint. These figures-of-merit are complementary to those of short-wavelength free-electron lasers (xFEL). xFEL facilities are currently available in a few sites, due to the remarkable cost of construction and operation. After a general introduction on laboratory-scale short-wavelength lasers, a comparison with state-of-art xFEL will be done.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Davide Bleiner "Comparison of laboratory-scale XUV laser with xFELs", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867806 (11 December 2012); https://doi.org/10.1117/12.2008733
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Cited by 2 scholarly publications.
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KEYWORDS
Plasma

Extreme ultraviolet

Ions

Ionization

X-ray lasers

Free electron lasers

Mirrors

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