Paper
26 March 2013 Orientation and position-controlled block copolymer nanolithography for bit-patterned media
R. Yamamoto, M. Kanamaru, K. Sugawara, N. Sasao, Y. Ootera, T. Okino, H. Hieda, N. Kihara, Y. Kamata, A. Kikitsu
Author Affiliations +
Abstract
Bit-patterned media (BPM) is a candidate for high-density magnetic recording media. Directed self-assembly (DSA) is expected to be a solution for the fabrication process of high-density BPM. A BPM with 20 nm-pitch dot pattern is fabricated. A 100 nm-pitch triangle lattice dot pattern, which is fabricated by EB lithography, is used as a guide post to order PS-PDMS self-assembled diblock co-polymer with 20 nm pitch. Dot-pitch fluctuation and linearity of pseudo dot tracks are estimated. The standard deviation of the dot-pitch variation including the post guide is 8% of the self-assembled dot pitch. The dot-position deviation is estimated to be about 8% of the pseudo dot track pitch. In both cases, variation of the size and pitch of the post guides is found to increase the dot-pitch fluctuation and dot-position deviation from pseudo dot-track.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Yamamoto, M. Kanamaru, K. Sugawara, N. Sasao, Y. Ootera, T. Okino, H. Hieda, N. Kihara, Y. Kamata, and A. Kikitsu "Orientation and position-controlled block copolymer nanolithography for bit-patterned media", Proc. SPIE 8680, Alternative Lithographic Technologies V, 86801U (26 March 2013); https://doi.org/10.1117/12.2012654
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KEYWORDS
Beam propagation method

Directed self assembly

Lithography

Magnetism

Carbon

Nanolithography

Photomasks

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