Paper
8 January 2013 Resonance properties of multilayer metallic nanocantilevers
Ilya V. Uvarov, Victor V. Naumov, Ildar I. Amirov
Author Affiliations +
Proceedings Volume 8700, International Conference Micro- and Nano-Electronics 2012; 87000S (2013) https://doi.org/10.1117/12.2016751
Event: International Conference on Micro-and Nano-Electronics 2012, 2012, Zvenlgorod, Russian Federation
Abstract
Resonant properties of the three-layer metallic cantilevers with 40 nm thickness are investigated. Two types of the nanocantilevers were fabricated: Cr-Al-Cr and Ti-Al-Ti. Resonant frequencies of the nanocantilevers were determined from the experimentally obtained resonant curves. Cantilever oscillations were excited by the electric force, the registration of the cantilever motion was performed by the optical lever method. Dependencies of the first and the second resonant frequencies on the cantilever length and width were experimentally obtained. The experimental data analysis and the comparison with the theoretical predictions were performed. Relations between the cantilever resonance properties and its dimensions and material are discussed.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ilya V. Uvarov, Victor V. Naumov, and Ildar I. Amirov "Resonance properties of multilayer metallic nanocantilevers", Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000S (8 January 2013); https://doi.org/10.1117/12.2016751
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Cited by 3 scholarly publications.
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KEYWORDS
Nanolithography

Metals

Semiconducting wafers

Surface roughness

Aluminum

Chromium

Nanoelectromechanical systems

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