Detection of covered materials in the TDS-THz setup

Norbert Palka

doi:10.1117/12.2015373

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31 May 2013 Detection of covered materials in the TDS-THz setup

Norbert Palka

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Proceedings Volume 8716, Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense; 871608 (2013) https://doi.org/10.1117/12.2015373
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

We report on a new method for extracting the characteristic features of covered materials, including Hexogen, in the range 0.5–1.8 THz. This time domain spectroscopy-based technique takes into account only part of the signal reflected from a covered sample, and analyzes it by Fourier transform. The obtained power spectrum has distinctive peaks that correspond to peaks measured in the transmission configuration and can be applied for further identification. We showed results obtained for the samples of hexogen, lactose, and tartaric acid covered with commonly used packaging materials such as plastic, foil, paper and cotton.

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Norbert Palka "Detection of covered materials in the TDS-THz setup", Proc. SPIE 8716, Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense, 871608 (31 May 2013); https://doi.org/10.1117/12.2015373

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