Subwavelength resonant nanostructured films for sensing

K. J. Alvine; B. E. Bernacki; J. D. Suter; W. D. Bennett; D. J. Edwards; A. Mendoza

doi:10.1117/12.2016547

29 May 2013 Subwavelength resonant nanostructured films for sensing

K. J. Alvine, B. E. Bernacki, J. D. Suter, W. D. Bennett, D. J. Edwards, A. Mendoza

Proceedings Volume 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V; 87252H (2013) https://doi.org/10.1117/12.2016547
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

We present a novel subwavelength nanostructure architecture that may be utilized for optical standoff sensing applications. The subwavelength structures are fabricated via a combination of nanoimprint lithography and metal sputtering to create metallic nanostructured films encased within a transparent media. The structures are based on the open ring resonator (ORR) architecture which has a characteristic resonance frequency. Any perturbation of the nanostructured films due to chemical or environmental effects can shift the resonant frequency and provide an indication of the external stimulus. This shift in resonance can be interrogated remotely either actively using either laser illumination or passively using hyperspectral or multispectral sensing. These structures may be designed to be either anisotropic or isotropic, which can also provide polarization-sensitive interrogation. Due to the nanometer scale of the structures, they can be tailored to be optically responsive in the visible or near infrared spectrum with a highly reflective resonant peak that is dependent solely on structural dimensions and material characteristics. We present experimental measurements of the optical response of these structures as a function of wavelength, polarization, and incident angle demonstrating the resonant effect in the near infrared region. Numerical modeling data showing the effect of different fabrication parameters such as structure parameters are also discussed.

Citation Download Citation

K. J. Alvine, B. E. Bernacki, J. D. Suter, W. D. Bennett, D. J. Edwards, and A. Mendoza "Subwavelength resonant nanostructured films for sensing", Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 87252H (29 May 2013); https://doi.org/10.1117/12.2016547

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available