Difference modeling enhancement of topographic super-resolution

Jeremy Straub

doi:10.1117/12.2014373

20 May 2013 Difference modeling enhancement of topographic super-resolution

Jeremy Straub

Proceedings Volume 8731, Laser Radar Technology and Applications XVIII; 87310R (2013) https://doi.org/10.1117/12.2014373
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

Super resolution techniques have been previously used enhance topographic data directly (instead of via enhancement of imagery). However, system performance degrades as the pattern database’s size increases. To keep system performance at an acceptable level, a smaller-than-optimal database must be utilized. This results in error being introduced due to differences in feature and average region height between the training and presented data. With the proposed approach, an area-average height value (AAHV) is computed. The work presented compares the averageheight- and-difference-pattern-based topographic approach to the previous actual-height-based version. The utility of incorporating an area of pattern overlap is also considered.

Citation Download Citation

Jeremy Straub "Difference modeling enhancement of topographic super-resolution", Proc. SPIE 8731, Laser Radar Technology and Applications XVIII, 87310R (20 May 2013); https://doi.org/10.1117/12.2014373

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available