Paper
22 June 2013 Near infrared non-destructive inspection of inner qualities by multivariate analysis
Chih-Wen Chen, Yih-Shing Lee, Shang-Ping Ying, Chien-Kuo Ku, Ming-Ying Hsu
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87692P (2013) https://doi.org/10.1117/12.2018603
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
In this study, multivariate data analysis, especially partial least squares regression (PLSR), is applied to analyze the near infrared absorbance spectra of fruit samples in order to acquire the inner qualities without destroying the samples. The calibration models have been established for the samples with raw data, first order derivative and second order derivative treatments, respectively. In the meantime, the models have been verified by using cross validation method. As anticipated, a model with higher correlation coefficient (r) and lower root mean square error of calibration (RMSEC) is preferred for both calibration and cross validation. The results reveal that the calibration models with second order derivative treatments have higher correlation coefficient, coefficient of determination, as well as lower RMSEC. Furthermore, the calibration models have been optimized by selecting partial wavelengths as new variables based on absorbance spectra and regression coefficient. The reasons why the calibration models are improved might be suitably cutting off partial wavelengths causing noises in the model.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chih-Wen Chen, Yih-Shing Lee, Shang-Ping Ying, Chien-Kuo Ku, and Ming-Ying Hsu "Near infrared non-destructive inspection of inner qualities by multivariate analysis", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692P (22 June 2013); https://doi.org/10.1117/12.2018603
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near infrared

Calibration

Absorbance

Inspection

Reflectivity

Chemistry

Spectroscopy

Back to Top