High-Q optical nanobeam cavities for label-free sensing

M. Ghazali A. Rahman; Philippe Velha; Richard M. De La Rue; Nigel P. Johnson

doi:10.1117/12.2017696

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3 May 2013 High-Q optical nanobeam cavities for label-free sensing

M. Ghazali A. Rahman, Philippe Velha, Richard M. De La Rue, Nigel P. Johnson

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Proceedings Volume 8774, Optical Sensors 2013; 87740G (2013) https://doi.org/10.1117/12.2017696
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.

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M. Ghazali A. Rahman, Philippe Velha, Richard M. De La Rue, and Nigel P. Johnson "High-Q optical nanobeam cavities for label-free sensing", Proc. SPIE 8774, Optical Sensors 2013, 87740G (3 May 2013); https://doi.org/10.1117/12.2017696

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