Dependence of the readout resolving on the thickness of nonlinear super-resolution thin films

Rui Wang; Jingsong Wei

doi:10.1117/12.2014734

24 January 2013 Dependence of the readout resolving on the thickness of nonlinear super-resolution thin films

Rui Wang, Jingsong Wei

Proceedings Volume 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage; 878205 (2013) https://doi.org/10.1117/12.2014734
Event: 2012 International Workshop on Information Data Storage and Ninth International Symposium on Optical Storage, 2012, Shanghai, China

Abstract

In this work, light beam is simulated through nonlinear super-resolution films by the finite element method. The results indicate that the transmitted beam can be reshaped and the light spot can be smaller than the diffraction limit due to the reshaping effect of strong nonlinear saturatable absorption. However, the size of the transmitted light spot cannot be decreased continuously with the increase of the film thickness, and the light spot size then decreases with the increase of the film thickness. The simulated results mean that the carrier-to-noise-ratio first increases, and then decreases with the film thickness, and there is an optimum film thickness for the read-only nonlinear super-resolution optical disks, which is consistent with the reported experimental results.

Citation Download Citation

Rui Wang and Jingsong Wei "Dependence of the readout resolving on the thickness of nonlinear super-resolution thin films", Proc. SPIE 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage, 878205 (24 January 2013); https://doi.org/10.1117/12.2014734

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