You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
18 November 2013High resolution optical surface testing using transport of intensity equation
Phase distribution may be determined by measuring only the intensity distributions along the optical axis via the Transport of Intensity Equation (TIE). TIE has been a viable alternative to interferometry techniques for experimental conditions where those techniques perform poorly. These conditions are either because of the requirement one applies on the spatial and temporal coherence of the optical source or because of sensitivity and resolution issues. Optical testing is crucial in applications using manufactured optical elements. In this paper, we developed a method and experimental realizations capable to use both Shake-Hartman wavefront sensing (SHWS) and TIE method for testing transparent and reflective optical surfaces. The integration of TIE and SHWS has the advantage for obtaining high spatial resolution and wide dynamic range which cannot be obtained using only one of those methods. We showed that the retrieved phase profile and quantified surface variations of unknown samples from both methods are in very good agreement with each other.
The alert did not successfully save. Please try again later.
Peyman Soltani, Ali-Reza Moradi, Ahmad Darudi, Ramin Shomali, "High resolution optical surface testing using transport of intensity equation ," Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87851K (18 November 2013); https://doi.org/10.1117/12.2026289