Paper
18 November 2013 Fourier transform methods applied to an optical heterodyne profilometer
Author Affiliations +
Proceedings Volume 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications; 87853H (2013) https://doi.org/10.1117/12.2025887
Event: 8th Ibero American Optics Meeting/11th Latin American Meeting on Optics, Lasers, and Applications, 2013, Porto, Portugal
Abstract
In this work, theory and experiment describe the performance of a surface profile measurement device based on optical heterodyne interferometry are presented. The object and reference beams propagating through the interferometer are obtained by single-pass through an acousto-optic modulator. The diffraction orders 0 and the Doppler-shifted +1 (object and reference beams, respectively) are manipulated to propagate collinearly towards the interferometer output where a fast photodetector is placed to collect the irradiance. The modulated optical signal is Fourier transformed using a data acquisition card and RF communications software. The peak centered at the acousto-optic frequency in the power spectrum is filtered and averaged. The irregularities on the surface of the reflective sample are proportional to the height of this peak. The profile of a reflective blazed grating has been sketched by translating laterally the sample using a nanopositioning system. Experimental results are compared to the measurement done with a scanning electron microscope. There has been found a good agreement between both methods.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Beltrán-González, G. García-Torales, and G. Martínez-Ponce "Fourier transform methods applied to an optical heterodyne profilometer", Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87853H (18 November 2013); https://doi.org/10.1117/12.2025887
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photodetectors

Heterodyning

Fourier transforms

Scanning electron microscopy

Bragg cells

Modulation

Profilometers

RELATED CONTENT


Back to Top