Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8788, including the Title Page, Copyright Information, Table of Contents, and the Conference Committee listing.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8788", Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878801 (13 May 2013); https://doi.org/10.1117/12.2028782
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Digital holography

Imaging systems

Optical testing

Inspection

Interferometry

3D metrology

Optical scanning systems

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