The simulation of behaviors of photodetectors under pulsed laser irritation

Xin Zheng; Xiang-ai Cheng; Xiangyang Yu; Le Qian; Tian Jiang

doi:10.1117/12.2011258

16 May 2013 The simulation of behaviors of photodetectors under pulsed laser irritation

Xin Zheng, Xiang-ai Cheng, Xiangyang Yu, Le Qian, Tian Jiang

Proceedings Volume 8796, 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012); 87960Q (2013) https://doi.org/10.1117/12.2011258
Event: 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012), 2012, Xi'an, Shaanxi, China

Abstract

Precise simulation of transient electrical behaviors of photodetectors under laser irradiation is becoming an increasingly concern. It not only can allow a detailed study and analysis of complex phenomena that cannot be carried out by experiments, but gives valuable information about the physical mechanisms which ultimately determine the response of the photodetectors. Finite difference numerical technique is adopted in the simulation to calculate the current response of photodetectors under pulsed laser irritation in this paper. To simulation the behaviors of photodetectors under pulsed laser irritation, the transport and trapping of carries and external circuit effects, including load resistance, junction capacitance, and parasitic capacitance, are considered. The basic equations governing the carrier behaviors are solved, including Poisson’s equation, the carrier motion equations, and the carrier continuity equations. The simulated transient carrier density and velocities are present, as well as corresponding transient electric field distributions. The behaviors of electrons and holes and its contributions to the external current response are analyzed. Then a general and brief image of the transient progress of photodetectors under pulsed laser irritation is established. How the carrier is induced, transported, and trapped and whether they make any significant contribution to the external current response are discussed. Besides, bias dependent response is also studied. Higher bias will improver the behaviors of photodetectors under pulsed laser irritation. The simulated results and theory analysis will show valuable clue for future research on the behaviors of photodetectors irradiated by pulsed laser.

Citation Download Citation

Xin Zheng, Xiang-ai Cheng, Xiangyang Yu, Le Qian, and Tian Jiang "The simulation of behaviors of photodetectors under pulsed laser irritation", Proc. SPIE 8796, 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012), 87960Q (16 May 2013); https://doi.org/10.1117/12.2011258

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Photodetectors

Pulsed laser operation

Electrons

Optical simulations

Sensors

Analytical research

Capacitance

Show All Keywords

Keywords/Phrases

Search In:

Publication Years