Paper
18 June 2013 Real-time depth-resolved Shack-Hartmann measurements
Author Affiliations +
Abstract
We demonstrate a direct Shack-Hartmann wavefront sensing method that allows depth-resolved measurements. A coherence-gate Shack-Hartmann wavefront sensor (CG/SH-WFS) is implemented by adding low coherence reflectometry gating to a SH-WFS. The depth resolution is determined by the coherence gate, much narrower than the depth range of the SH-WFS. Distinctive wavefronts are measured from five layers in a multiple-layer target. This paves the way towards depth-resolved closed-loop adaptive optics assisted microscopy and imaging of the retina.
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Jingyu Wang and Adrian Gh. Podoleanu "Real-time depth-resolved Shack-Hartmann measurements", Proc. SPIE 8802, Optical Coherence Tomography and Coherence Techniques VI, 88020B (18 June 2013); https://doi.org/10.1117/12.2032507
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KEYWORDS
Wavefront sensors

Wavefronts

Adaptive optics

Mirrors

Interfaces

Microscopy

Scattering

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