Paper
11 September 2013 Probing the transition between the long-wavelength and the short-wavelength regimes of light propagation in all-dielectric metamaterials
Eric Cassan, Jean Dellinger, Xavier Le Roux, Khanh Van Do, Charles Caer, Frédérique de Fornel, Benoit Cluzel
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Abstract
The transition between the long-wavelength and the short-wavelength regimes of light propagation in all-dielectric metamaterials is experimentally probed using a hyperspectral near-field scanning microscope technique. Our measurements lead to an invariant quantity “λ/n” of only 1.78 times the dielectric lattice period as the criterion for the possible application of homogenization theories.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric Cassan, Jean Dellinger, Xavier Le Roux, Khanh Van Do, Charles Caer, Frédérique de Fornel, and Benoit Cluzel "Probing the transition between the long-wavelength and the short-wavelength regimes of light propagation in all-dielectric metamaterials", Proc. SPIE 8806, Metamaterials: Fundamentals and Applications VI, 88062A (11 September 2013); https://doi.org/10.1117/12.2024229
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KEYWORDS
Photonic crystals

Line width roughness

Metamaterials

Light wave propagation

Geometrical optics

Near field scanning optical microscopy

Dielectrics

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