System high voltage stress degradation test in various photovoltaic modules and encapsulant sheets

Han-Chang Liu; Wen-Kuei Lee; Mei-Hsiu Lin; Chung-Teng Huang; Fu-Ming Lin; Jen-Loong Huang

doi:10.1117/12.2023644

24 September 2013 System high voltage stress degradation test in various photovoltaic modules and encapsulant sheets

Han-Chang Liu, Wen-Kuei Lee, Mei-Hsiu Lin, Chung-Teng Huang, Fu-Ming Lin, Jen-Loong Huang

Proceedings Volume 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI; 88250R (2013) https://doi.org/10.1117/12.2023644
Event: SPIE Solar Energy + Technology, 2013, San Diego, California, United States

Abstract

The more and more solar power requirements and balance of system (BOS) cost saving issues, photovoltaic power plants have increasing system voltage, in Europe, for example, the system voltage requirements up to 1000 volts to 1500 volts. Solar module reliability expose to the high voltage stress (HVS) need reassessment. It is well-known that HVS can lower the PV power significantly that means potential induced degradation (PID) effect. However, the effects of the PID and other environmental conditions on module performance have not been included in the IEC qualification standards yet. In this paper we review various PV module type, example MG-Si, poly-Si, CIGS module and encapsulant sheets performance suffer high voltage stress effect. To evaluate module durability in the presence of continuous high voltage we used four accelerated tests to qualify the HVS effect. The first one is under room temperature, 100% relative humidity (RH), second method is room temperature and aluminum foil covered the front sheet, the third method is climatic chamber test at 85℃and 85% RH and the last one is the 60°C and 85%RH with -1000V bias applied to active layer, respectively. The I-V characteristics and Electroluminescence (EL) images have been measured after several time steps to quantify the degradation process of each module. Besides the recovery characterization was also investigation.

Citation Download Citation

Han-Chang Liu, Wen-Kuei Lee, Mei-Hsiu Lin, Chung-Teng Huang, Fu-Ming Lin, and Jen-Loong Huang "System high voltage stress degradation test in various photovoltaic modules and encapsulant sheets", Proc. SPIE 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI, 88250R (24 September 2013); https://doi.org/10.1117/12.2023644

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available