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6 September 2013 Spatial fringe analysis based on FFT using only two speckle pattern in ESPI
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High resolution deformation measurement method which requires only two speckle patterns in fringe analysis is proposed. In fringe analysis based on proposed optical system for new method, a pair of real- and imaginary-part components concerning the deformation information can be extracted from one speckle pattern by Fourier transform. The real part is shifted on frequency domain in order to give the information of carrier fringes. Furthermore, the amplitude of the intensity distribution is normalized so that the amplitude becomes one. A specklegram is calculated as a fringe image by the shifted and the non-shifted real parts of information. The fringe image which includes the spatial carrier-information is analyzed by spatial fringe analysis method based on moiré fringe analysis. The accuracy of the deformation measurement is efficiently improved by using the spatial fringe analysis method and the normalization of the amplitude. It is confirmed that the method can analyze deformation process with a convex phase distribution in high resolution power.
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Yasuhiko Arai "Spatial fringe analysis based on FFT using only two speckle pattern in ESPI", Proc. SPIE 8839, Dimensional Optical Metrology and Inspection for Practical Applications II, 883902 (6 September 2013);

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