Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography

Kadda Medjoubi; Alain Bonissent; Nicolas Leclercq; Florent Langlois; Pascal Mercère; Andrea Somogyi

doi:10.1117/12.2026680

26 September 2013 Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography

Kadda Medjoubi, Alain Bonissent, Nicolas Leclercq, Florent Langlois, Pascal Mercère, Andrea Somogyi

Author Affiliations +

Proceedings Volume 8851, X-Ray Nanoimaging: Instruments and Methods; 88510P (2013) https://doi.org/10.1117/12.2026680
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

Scanning hard X-ray nanoprobe imaging provides a unique tool for probing specimens with high sensitivity and large penetration depth. Moreover, the combination of complementary techniques such as X-ray fluorescence, absorption, phase contrast and dark field imaging gives complete quantitative information on the sample structure, composition and chemistry. The multi-technique “FLYSCAN” data acquisition scheme developed at Synchrotron SOLEIL permits to perform fast continuous scanning imaging and as such makes scanning tomography techniques feasible in a time-frame well-adapted to typical user experiments. Here we present the recent results of simultaneous fast scanning multi-technique tomography performed at Soleil. This fast scanning scheme will be implemented at the Nanoscopium beamline for large field of view 2D and 3D multimodal imaging.

Citation Download Citation

Kadda Medjoubi, Alain Bonissent, Nicolas Leclercq, Florent Langlois, Pascal Mercère, and Andrea Somogyi "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510P (26 September 2013); https://doi.org/10.1117/12.2026680

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