Silicon optics for wide field x-ray imaging

R. Willingale; M. Ackermann; M. Collon

doi:10.1117/12.2026536

26 September 2013 Silicon optics for wide field x-ray imaging

R. Willingale, M. Ackermann, M. Collon

Proceedings Volume 8861, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI; 88611O (2013) https://doi.org/10.1117/12.2026536
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

Silicon pore optics (SPO)¹ were originally designed to provide very large collecting areas combined with good angular resolution in narrow field X-ray telescopes. We describe modifications to the geometry and manufacture of SPO to facilitate wide field X-ray imaging applications. Modest changes can greatly improve the vignetting function and off-axis angular resolution of SPO in the Wolter I geometry. Reconfiguring SPO to form Kirkpatrick- Baez stacks in the Schmidt geometry can provide very large fields of view with high angular resolution and large collecting area.

Citation Download Citation

R. Willingale, M. Ackermann, and M. Collon "Silicon optics for wide field x-ray imaging", Proc. SPIE 8861, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI, 88611O (26 September 2013); https://doi.org/10.1117/12.2026536

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