Paper
19 July 2013 Fabric defect detection based on annular Gaussian band-pass filters
Runping Han, Jianxia Su
Author Affiliations +
Proceedings Volume 8878, Fifth International Conference on Digital Image Processing (ICDIP 2013); 88782N (2013) https://doi.org/10.1117/12.2030623
Event: Fifth International Conference on Digital Image Processing, 2013, Beijing, China
Abstract
A new method for fabric defect detection is proposed. It is based on the filter group containing four annular Gaussian band-pass filters and aimed at detecting defects in fabrics with plain and twill structures. A fabric sample image is processed by using this filter group and the filtered images are obtained. These filtered images are binarized and fused in order to reconstruct the defect binary image that distinguishes defects from texture background. In the performance evaluation and comparison experiments, this method is applied to a variety of fabrics with various defects. Experiment results have confirmed this method has good real time performance and is effective in fabric defect detection.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Runping Han and Jianxia Su "Fabric defect detection based on annular Gaussian band-pass filters", Proc. SPIE 8878, Fifth International Conference on Digital Image Processing (ICDIP 2013), 88782N (19 July 2013); https://doi.org/10.1117/12.2030623
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KEYWORDS
Image filtering

Defect detection

Bandpass filters

Gaussian filters

Linear filtering

Image processing

Image segmentation

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