4D phase profile measurements using a single-shot phase shifting technique

Noel-Ivan Toto-Arellano; A. Montes-Pérez; A. Martínez García; David Serrano-García; Luis R. Castelán Olvera; Jonathan Martínez Lozano; Anuar Jorge Muñoz

doi:10.1117/12.2026483

15 October 2013 4D phase profile measurements using a single-shot phase shifting technique

Noel-Ivan Toto-Arellano, A. Montes-Pérez, A. Martínez García, David Serrano-García, Luis R. Castelán Olvera, Jonathan Martínez Lozano, Anuar Jorge Muñoz

Author Affiliations +

Proceedings Volume 8884, Optifab 2013; 888427 (2013) https://doi.org/10.1117/12.2026483
Event: SPIE Optifab, 2013, Rochester, New York, United States

Abstract

In this paper, we propose a Quasi Common-Path Interferometer based on a two beams configuration using simultaneous phase shifting interferometry modulated by polarization. Due to the fact that the configuration is capable of obtaining two beams whose separation can be varied, according to the characteristics of the grid used, to obtain the interference patterns. It can be used to implement a quasi-common path interferometer that allows the measurement of dynamic events with high accuracy. For demodulate the fringe patterns generated by the optical system we using the conventional four step phase shifting method. Experimental results are also given.

Citation Download Citation

Noel-Ivan Toto-Arellano, A. Montes-Pérez, A. Martínez García, David Serrano-García, Luis R. Castelán Olvera, Jonathan Martínez Lozano, and Anuar Jorge Muñoz "4D phase profile measurements using a single-shot phase shifting technique", Proc. SPIE 8884, Optifab 2013, 888427 (15 October 2013); https://doi.org/10.1117/12.2026483

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