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22 October 2013 Snapshot imaging Mueller matrix instrument
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A novel way to measure the Mueller matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael W. Kudenov, Sushmit Mallik, Michael J. Escuti, Nathan Hagen, Kazuhiko Oka, and Eustace L. Dereniak "Snapshot imaging Mueller matrix instrument", Proc. SPIE 8897, Electro-Optical Remote Sensing, Photonic Technologies, and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolution Sensing, 88970S (22 October 2013);

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