Paper
25 July 2013 Modeling the current of a double-gate MOSFET with very thin active region taking into account mobility dependence on the transverse electric field
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Proceedings Volume 8902, Electron Technology Conference 2013; 89020L (2013) https://doi.org/10.1117/12.2031070
Event: Electron Technology Conference 2013, 2013, Ryn, Poland
Abstract
Drain current and transconductance of a symmetrical, undoped double-gate MOSFET is modeled for the first time with mobility depending on both the applied voltage and position in the channel leading to analytical formulae. The obtained models are compared with simplified formulae assuming position-independent effective mobility. Good agreement is obtained in the case of one of the selected mobility models.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lidia Łukasiak and Bogdan Majkusiak "Modeling the current of a double-gate MOSFET with very thin active region taking into account mobility dependence on the transverse electric field", Proc. SPIE 8902, Electron Technology Conference 2013, 89020L (25 July 2013); https://doi.org/10.1117/12.2031070
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KEYWORDS
Field effect transistors

Oxides

Silicon

Instrument modeling

Data modeling

Process control

Microelectronics

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