Improving the spectral resolution of soft x-ray flat-field spectrometer with multi-area gratings

Huoyao Chen; Zhengkun Liu; Qingbo Wang; Shaojun Fu

doi:10.1117/12.2035205

30 August 2013 Improving the spectral resolution of soft x-ray flat-field spectrometer with multi-area gratings

Huoyao Chen, Zhengkun Liu, Qingbo Wang, Shaojun Fu

Proceedings Volume 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications; 89102A (2013) https://doi.org/10.1117/12.2035205
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

The ideal focal curve for the soft x-ray flat-field spectrometer is a straight line, but the real one is not, thus the inconformity of aberrations between different wavelengths in the working waveband is inevitable. In order to further reduce aberrations and improve spectral resolutions, multi-area gratings (divided perpendicular the direction of grating grooves) are devised. Firstly, the grating is divided into three areas, and the spectral aberrations for these areas are analyzed by means of ray tracing. Then, diffraction efficiencies for the areas with worse aberrations should be reduced to lower the proportion regional aberrations contributing to the overall aberration, therefore better spectral image could be obtained and the spectral resolution would be improved. Theoretical analysis demonstrates that: using multi-area grating, the spectral resolutions at wavelength of 0.8 and 1.1nm are increased from 123 and 333 to 401 and 671, respectively. At the same time, the spectral resolutions at other wavelengths are not reduced.

Citation Download Citation

Huoyao Chen, Zhengkun Liu, Qingbo Wang, and Shaojun Fu "Improving the spectral resolution of soft x-ray flat-field spectrometer with multi-area gratings", Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89102A (30 August 2013); https://doi.org/10.1117/12.2035205

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KEYWORDS

Spectral resolution

Diffraction gratings

Diffraction

Spectroscopy

X-rays

Image quality

Optical design

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