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16 August 2013 Design of measurement system for low illuminance CCD’s key performance parameters
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Proceedings Volume 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications; 89121I (2013) https://doi.org/10.1117/12.2034871
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
As an important photovoltaic detector in the night vision imaging systems, some main performance parameters decide the properties of the low illuminance CCDs greatly including noise, quantum effects, dynamic range and dark current, and it is necessary to design a measurement system to measure the performance parameters of the low illuminance CCD. This article designs a set of low illuminance CCD chips’ performance parameter measurement system, which is consisted of five parts including adjustable monochromatic light source, integrating sphere-darkroom, Dewar control chamber, main control circuit and the master computer software for automatic measurement. By persistent demonstration, the performance parameters measurement system which is focused on the low illuminance CCD proposed in this paper has the advantages of compact, good compatibility, theoretical measurement precision and fully automated measurement etc.The appropriate equipment and instruments are selected in this measurement system. And the connections of each subsystem are designed independently, which guarantees the tightness of the total system, eliminate the effects of stray light at the same time and improves the measurement accuracy of the system. Besides, this measurement system solves the generation of monochromatic light, and the measurement of low illuminance CCDs at a low temperature.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao-peng Shao, Juan Du, and Yang Wang "Design of measurement system for low illuminance CCD’s key performance parameters", Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 89121I (16 August 2013); https://doi.org/10.1117/12.2034871
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