Implementation of PSF engineering in high-resolution 3D microscopy imaging with a LCoS (reflective) SLM

Sharon V. King; Ana Doblas; Nurmohammed Patwary; Genaro Saavedra; Manuel Martínez-Corral; Chrysanthe Preza

doi:10.1117/12.2040723

12 March 2014 Implementation of PSF engineering in high-resolution 3D microscopy imaging with a LCoS (reflective) SLM

Sharon V. King, Ana Doblas, Nurmohammed Patwary, Genaro Saavedra, Manuel Martínez-Corral, Chrysanthe Preza

Proceedings Volume 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI; 894913 (2014) https://doi.org/10.1117/12.2040723
Event: SPIE BiOS, 2014, San Francisco, California, United States

Abstract

Wavefront coding techniques are currently used to engineer unique point spread functions (PSFs) that enhance existing microscope modalities or create new ones. Previous work in this field demonstrated that simulated intensity PSFs encoded with a generalized cubic phase mask (GCPM) are invariant to spherical aberration or misfocus; dependent on parameter selection. Additional work demonstrated that simulated PSFs encoded with a squared cubic phase mask (SQUBIC) produce a depth invariant focal spot for application in confocal scanning microscopy. Implementation of PSF engineering theory with a liquid crystal on silicon (LCoS) spatial light modulator (SLM) enables validation of WFC phase mask designs and parameters by manipulating optical wavefront properties with a programmable diffractive element. To validate and investigate parameters of the GCPM and SQUBIC WFC masks, we implemented PSF engineering in an upright microscope modified with a dual camera port and a LCoS SLM. We present measured WFC PSFs and compare them to simulated PSFs through analysis of their effect on the microscope imaging system properties. Experimentally acquired PSFs show the same intensity distribution as simulation for the GCPM phase mask, the SQUBIC-mask and the well-known and characterized cubic-phase mask (CPM), first applied to high NA microscopy by Arnison et al.¹⁰, for extending depth of field. These measurements provide experimental validation of new WFC masks and demonstrate the use of the LCoS SLM as a WFC design tool. Although efficiency improvements are needed, this application of LCoS technology renders the microscope capable of switching among multiple WFC modes.

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Sharon V. King, Ana Doblas, Nurmohammed Patwary, Genaro Saavedra, Manuel Martínez-Corral, and Chrysanthe Preza "Implementation of PSF engineering in high-resolution 3D microscopy imaging with a LCoS (reflective) SLM", Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 894913 (12 March 2014); https://doi.org/10.1117/12.2040723

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