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12 July 1988 Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments
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Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988) https://doi.org/10.1117/12.944518
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
The elastic scattering efficiency from subwavelength-size surface holes or protrusions depends sensitively on the dielectric properties of their immediate environment. Scanning near-field optical microscopy exploits this effect to create optical images whose resolution is not restricted by the diffraction limit. Typically, 20 nm laterally and, when operated in a topographic mode, 0.1 nm in height can be resolved. Images were obtained both in transmission and reflection.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. W. Pohl, U. Ch. Fischer, and U. T. Durig "Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); https://doi.org/10.1117/12.944518
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