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24 February 2014 "Multidimensional reflectometry for industry" (xD-Reflect) an European research project
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Proceedings Volume 9018, Measuring, Modeling, and Reproducing Material Appearance; 901804 (2014)
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
The European Metrology Research Program (EMRP) is a metrology-focused program of coordinated Research and Development (RD) funded by the European Commission and participating countries within the European Association of National Metrology Institutes (EURAMET). It supports and ensures research collaboration between them by launching and managing different types of project calls. Within the EMRP Call 2012 "Metrology for Industry", the joint research project (JRP) entitled "Multidimensional Reflectometry for Industry" (xD-Reflect) was submitted by a consortium of 8 National Metrology Institutes (NMIs) and 2 universities and was subsequently funded. The general objective of xD-Reflect is to meet the demands from industry to describe the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with the "Goniochromatism", "Gloss" and "Fluorescence" properties of dedicated artifacts, which will be investigated in three main work packages (WP). Two additional transversal WP reinforce the structure: "Modelling and Data Analysis" with the objective to give an irreducible set of calibration schemes and handling methods and "Visual Perception", which will produce perception scales for the different visual attributes. Multidimensional reflectometry involves the enhancement of spectral and spatial resolution of reference gonioreflectometers for BRDF measurements using modern detectors, conoscopic optical designs, CCD cameras, line scan cameras, and modern light sources in order to describe new effects like sparkle and graininess/coarseness. More information and updated news concerning the project can be found on the xD-Reflect website
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Höpe, Annette Koo, Francisco Martinez Verdú, Frédéric B. Leloup, Gaël Obein, Gerd Wübbeler, Joaquín Campos, Paola Iacomussi, Priit Jaanson, Stefan Källberg, and Marek Šmíd ""Multidimensional reflectometry for industry" (xD-Reflect) an European research project", Proc. SPIE 9018, Measuring, Modeling, and Reproducing Material Appearance, 901804 (24 February 2014);

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