The European Metrology Research Program (EMRP) is a metrology-focused program of coordinated Research and
Development (RD) funded by the European Commission and participating countries within the European Association
of National Metrology Institutes (EURAMET). It supports and ensures research collaboration between them by
launching and managing different types of project calls. Within the EMRP Call 2012 "Metrology for Industry", the joint
research project (JRP) entitled "Multidimensional Reflectometry for Industry" (xD-Reflect) was submitted by a
consortium of 8 National Metrology Institutes (NMIs) and 2 universities and was subsequently funded. The general
objective of xD-Reflect is to meet the demands from industry to describe the overall macroscopic appearance of modern
surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being
evoked. In particular, the project deals with the "Goniochromatism", "Gloss" and "Fluorescence" properties of dedicated
artifacts, which will be investigated in three main work packages (WP). Two additional transversal WP reinforce the
structure: "Modelling and Data Analysis" with the objective to give an irreducible set of calibration schemes and
handling methods and "Visual Perception", which will produce perception scales for the different visual attributes.
Multidimensional reflectometry involves the enhancement of spectral and spatial resolution of reference
gonioreflectometers for BRDF measurements using modern detectors, conoscopic optical designs, CCD cameras, line
scan cameras, and modern light sources in order to describe new effects like sparkle and graininess/coarseness. More
information and updated news concerning the project can be found on the xD-Reflect website http://www.xdreflect.eu/.