Paper
7 March 2014 Architectures and algorithms for x-ray diffraction imaging
Ke Chen, David A. Castañón
Author Affiliations +
Proceedings Volume 9020, Computational Imaging XII; 902006 (2014) https://doi.org/10.1117/12.2047282
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
Abstract
X-ray imaging is the predominant modality used in luggage inspection systems for explosives detection. Conventional or dual energy X-ray computed tomography imaging reconstructs the X-ray absorption characteristics of luggage contents at the different energies; however, material characterization based on absorption characteristics at these energies is often ambiguous. X-ray diffraction imaging (XDI) measures coherently scattered X-rays to construct diffraction profiles of materials that can provide additional molecular signature information to improve the identification of specific materials. In this paper, we present recent work on developing XDI algorithms for different architectures, which include limited angle tomography and the use of coded aperture masks. We study the potential benefits of fusion of dual energy CT information with X-ray diffraction imaging. We illustrate the performance of different approaches using Monte Carlo propagation simulations through 3-D media.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ke Chen and David A. Castañón "Architectures and algorithms for x-ray diffraction imaging", Proc. SPIE 9020, Computational Imaging XII, 902006 (7 March 2014); https://doi.org/10.1117/12.2047282
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KEYWORDS
Signal attenuation

Sensors

Reconstruction algorithms

X-rays

X-ray imaging

3D modeling

Scattering

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