Paper
27 March 2014 Adsorption characteristics of lithography filters in various solvents using application-specific ratings
Toru Umeda, Shuichi Tsuzuki
Author Affiliations +
Abstract
It is known that DUV resist filtration using Nylon 6,6 membrane significantly reduces microbridge defects. Previous work has described a method to determine an adsorption performance index using modified metal nanoparticles, which simulate interactions with microbridge defect precursors. In this paper, the effects of filter grade, filter material, and solvent type on adsorptive retention are explored. The adsorption rate in Nylon 6,6 40 nm filter was observed to be greater in both lower-LogPow and lower-viscosity solvents, possibly providing a direction for improved filtration performance based on the solvent properties. The complementary adsorption kinetics parameters give a more accurate suggestion for the filter performance in lithography applications combined with the conventional sieving filter ratings.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toru Umeda and Shuichi Tsuzuki "Adsorption characteristics of lithography filters in various solvents using application-specific ratings", Proc. SPIE 9051, Advances in Patterning Materials and Processes XXXI, 90511G (27 March 2014); https://doi.org/10.1117/12.2046588
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Adsorption

Lithography

Nanoparticles

Palladium

Metals

Particles

Deep ultraviolet

Back to Top