Translator Disclaimer
10 April 2014 Thermo-electrical lockin thermography for characterization of subsurface defects
Author Affiliations +
In the present work, a novel method of infrared (IR) thermography called Thermo - Electrical Lockin Thermography (TELT) was developed for the characterization of subsurface defects in materials and structures. This new IR thermography method is based on the thermal excitation of materials under testing using a Peltier device and appropriate electronics allowing for accurate thermal cycling. Results from using this method were compared with different IR methodologies (i.e. Pulsed Phase thermography). It was found that Thermo - Electrical Lockin Thermography provides not only qualitative but also quantitative results.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Z. Kordatos, D. A. Exarchos, K. G. Dassios, and T. E. Matikas "Thermo-electrical lockin thermography for characterization of subsurface defects", Proc. SPIE 9062, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2014, 90620G (10 April 2014);

Back to Top