Test equipment and methods to characterize fully assembled SWIR digital imaging systems

John Green; Tim Robinson

doi:10.1117/12.2052028

29 May 2014 Test equipment and methods to characterize fully assembled SWIR digital imaging systems

John Green, Tim Robinson

Proceedings Volume 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV; 90710U (2014) https://doi.org/10.1117/12.2052028
Event: SPIE Defense + Security, 2014, Baltimore, MD, United States

Abstract

This paper describes test equipment and methods used to characterize short-wave infrared (SWIR) digital imaging systems. The test equipment was developed under the Air Force Research Laboratory (AFRL) contract Advanced Night Vision Imaging System – Cockpit Integration. The test equipment measures relative spectral responsivity, noise equivalent irradiance, dynamic range, linearity, dark noise, image uniformity, and captures image artifacts.

Citation Download Citation

John Green and Tim Robinson "Test equipment and methods to characterize fully assembled SWIR digital imaging systems", Proc. SPIE 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV, 90710U (29 May 2014); https://doi.org/10.1117/12.2052028

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available