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21 May 2014 Analysis and simulation of a new kind of noise at the input stage of infrared focal plane array
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Abstract
Noise is a primary characteristic of an infrared focal plane array (FPA) that contributes to detection performance at low light level. In a capacitive-feedback trans-impedance amplifier (CTIA)-based readout integrated circuit (ROIC), reset noise can be removed by correlated double sampling (CDS). There is an exotic experimental phenomenon that FPA noise will increase greatly if the first sampling time of CDS is less than a threshold value. A noise model at FPA interface is presented in this paper which explains that this new kind of noise originates from incompletely settling of CTIA preamplifier. As this noise is performed in time domains, we use transient noise simulation technique to describe the dependence of this noise on detector pixel capacitance, integration capacitor, and some other design parameters. Based on the theoretical model analysis and simulation results, effective design method is obtained to reduce this kind of noise.
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Zhangcheng Huang, Yu Chen, Songlei Huang, and Jiaxiong Fang "Analysis and simulation of a new kind of noise at the input stage of infrared focal plane array", Proc. SPIE 9100, Image Sensing Technologies: Materials, Devices, Systems, and Applications, 91000T (21 May 2014); https://doi.org/10.1117/12.2050192
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