Two-wavelength phase shift interferometry to characterize ballistic features

Glenn W. Pagano; Christopher J. Mann

doi:10.1117/12.2051859

1 May 2014 Two-wavelength phase shift interferometry to characterize ballistic features

Proceedings Volume 9131, Optical Modelling and Design III; 91311K (2014) https://doi.org/10.1117/12.2051859
Event: SPIE Photonics Europe, 2014, Brussels, Belgium

Abstract

We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

Citation Download Citation

Glenn W. Pagano and Christopher J. Mann "Two-wavelength phase shift interferometry to characterize ballistic features", Proc. SPIE 9131, Optical Modelling and Design III, 91311K (1 May 2014); https://doi.org/10.1117/12.2051859

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available