Paper
14 July 2014 Gemini planet imager observational calibrations III: empirical measurement methods and applications of high-resolution microlens PSFs
Author Affiliations +
Abstract
The newly commissioned Gemini Planet Imager (GPI) combines extreme adaptive optics, an advanced coronagraph, precision wavefront control and a lenslet-based integral field spectrograph (IFS) to measure the spectra of young extrasolar giant planets between 0.9-2.5 μm. Each GPI detector image, when in spectral model, consists of ~37,000 microspectra which are under or critically sampled in the spatial direction. This paper demonstrates how to obtain high-resolution microlens PSFs and discusses their use in enhancing the wavelength calibration, flexure compensation and spectral extraction. This method is generally applicable to any lenslet-based integral field spectrograph including proposed future instrument concepts for space missions.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrick Ingraham, Jean-Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, and Vincent Fesquet "Gemini planet imager observational calibrations III: empirical measurement methods and applications of high-resolution microlens PSFs", Proc. SPIE 9147, Ground-based and Airborne Instrumentation for Astronomy V, 91477K (14 July 2014); https://doi.org/10.1117/12.2055283
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Point spread functions

Microlens

Gemini Planet Imager

Sensors

Electroluminescent displays

Calibration

Spectral resolution

Back to Top