Gemini planet imager observational calibrations III: empirical measurement methods and applications of high-resolution microlens PSFs

Patrick Ingraham; Jean-Baptiste Ruffio; Marshall D. Perrin; Schuyler G. Wolff; Zachary H. Draper; Jerome Maire; Franck Marchis; Vincent Fesquet

doi:10.1117/12.2055283

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14 July 2014 Gemini planet imager observational calibrations III: empirical measurement methods and applications of high-resolution microlens PSFs

Patrick Ingraham, Jean-Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, Vincent Fesquet

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Proceedings Volume 9147, Ground-based and Airborne Instrumentation for Astronomy V; 91477K (2014) https://doi.org/10.1117/12.2055283
Event: SPIE Astronomical Telescopes + Instrumentation, 2014, Montréal, Quebec, Canada

Abstract

The newly commissioned Gemini Planet Imager (GPI) combines extreme adaptive optics, an advanced coronagraph, precision wavefront control and a lenslet-based integral field spectrograph (IFS) to measure the spectra of young extrasolar giant planets between 0.9-2.5 μm. Each GPI detector image, when in spectral model, consists of ~37,000 microspectra which are under or critically sampled in the spatial direction. This paper demonstrates how to obtain high-resolution microlens PSFs and discusses their use in enhancing the wavelength calibration, flexure compensation and spectral extraction. This method is generally applicable to any lenslet-based integral field spectrograph including proposed future instrument concepts for space missions.

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Patrick Ingraham, Jean-Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, and Vincent Fesquet "Gemini planet imager observational calibrations III: empirical measurement methods and applications of high-resolution microlens PSFs", Proc. SPIE 9147, Ground-based and Airborne Instrumentation for Astronomy V, 91477K (14 July 2014); https://doi.org/10.1117/12.2055283

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