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11 October 1988 An Instrument For Measuring The Bi-Directional Reflectivity Of Surfaces In The 3 - 5 And 8 - 12 Micron Bands
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Proceedings Volume 0916, Infrared Systems--Design and Testing; (1988)
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom
The 3-5 and 8-12 micron wavelength bands are the two main atmospheric transmission windows used for thermal imaging. For military and other applications of these imagers it is important to have data about the emissivity and reflectivity of different surfaces and surface finishes and how these vary with the angle of incidence and the angle of reflection. In general the appearance of a surface in a thermal image will depend not only on its temperature but on the angle at which it is viewed, the radiation incident on it from surrounding sources (eg the sun, sky or clouds) and the manner in which these are affected by the emissivity and reflectance characteristics of the surface and their angular dependence. The equipment described in this paper is designed to measure these characteristics of a surface in either of the two thermal wavelength bands or for any limited wavelength range in these bands. The bi-directional reflectivity is the primary parameter measured, since in principle the emissivity can be calculated from this. However the equipment can also be configured to measure emissivity directly.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. L. Williams, R. Hunt, N. T. Davidson, K. Cowey, and K. Smith "An Instrument For Measuring The Bi-Directional Reflectivity Of Surfaces In The 3 - 5 And 8 - 12 Micron Bands", Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988);


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