The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)

Yan Li; Nan Zhou; Edward C. Kinzel; Xifeng Ren; Xianfan Xu

doi:10.1117/12.2062810

19 November 2014 The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)

Yan Li, Nan Zhou, Edward C. Kinzel, Xifeng Ren, Xianfan Xu

Author Affiliations +

Proceedings Volume 9169, Nanoimaging and Nanospectroscopy II; 91690I (2014) https://doi.org/10.1117/12.2062810
Event: SPIE NanoScience + Engineering, 2014, San Diego, California, United States

Abstract

In this work, we investigate the formation of interference patterns appearing in s-NSOM results. A single nanoslit is used to demonstrate the mechanism of formation of these interference patterns experimentaly: the interaction between the in-plane component of the incident light and SPP launched by the nanoslit. This is in contrast to some other explanations that the SPP is launched from the NSOM probe. We also use an analytical model and numerical simulations to compute the formation of interference patters. This study will help to understand s-NSOM results from plasmonic nanostructures.

Citation Download Citation

Yan Li, Nan Zhou, Edward C. Kinzel, Xifeng Ren, and Xianfan Xu "The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)", Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 91690I (19 November 2014); https://doi.org/10.1117/12.2062810

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